To measure X-ray diffraction plots from various thin metallic films optimizing measurement conditions with the goal to select the best measurement scheme and determine the best measurement scheme and determine the instrumental function of different optical elements.
Contact: Dr. ir. Robbert van de Kruijs (r.w.e.vandekruijs@utwente.nl) , or contact prof.dr.Marcelo Ackermann.
| Job Category | Bachelor Assignment, Final assignment, Master Assignment |
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