Measurement and preliminary analysis of crystalline sizes in thin metallic films

Posted 3 months ago

To measure X-ray diffraction plots from various thin metallic films optimizing measurement conditions with the goal to select the best measurement scheme and determine the best measurement scheme and determine the instrumental function of different optical elements. 

Contact: Dr. ir. Robbert van de Kruijs (r.w.e.vandekruijs@utwente.nl) , or contact prof.dr.Marcelo Ackermann.

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Job CategoryBachelor Assignment, Final assignment, Master Assignment