Contact: Dr. Parikshit Phadke (p.phadke@utwente.nl) Ion beam-induced surface modifications are at the forefront of mo…
Contact: Maarten Swanenberg (NXP Nijmegen): maarten.swanenberg@nxp.comRay Hueting (Power Electroni…
Low-energy ion scattering (LEIS) probes the outermost atomic layer of a surface by backscattering of noble gas ions. Under certain conditions, also depth profiles up to 5–10 nm depth can be obtained…
To measure X-ray diffraction plots from various thin metallic films optimizing measurement conditions with the goal to select the best measurement scheme and determine the best measurement scheme and …
A broadband transmission grating spectrometer approach The XUV Optics group is undertaking an exciting project based on a newly developed optical component: a nanoscale patterned transmission grating …
Low Energy Ion Scattering (LEIS) is a surface analysis technique almost exclusively sensitive to a topmost layer composition. We recently found out that in a rare selection of materials a contribution…
This project aims for the development of multilayer systems for the use as spectroscopic elements. These serve the purpose of analyzing soft x-ray emission spectra of materials e.g. upon excitation by…
Introduction Graphene is a mechanically strong and optically transparent material suited for fabricating freestanding conductive see-through membranes for numerous applications such as filtration, sen…
Objective: This assignment provides a possibility to experimentally study the thermodynamics-induced changes in ultra-thin layer using advances X-ray analysis. This assignment will help you to develop…
Objective: This assignment provides a possibility to experimentally study the thermodynamics-induced changes in ultra-thin layer using advances X-ray analysis. This assignment will help you to develop…
